MEASURING INSTRUMENTS CATALOG No.E2016
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G-56GMitutoyo operates a policy of continuous improvement that aims to provide the customer with the benet of the latest technological advances.Therefore the company reserves the right to change any or all aspects of any product specication without notice.G-56G■CompatibilityYour Laser Scan Micrometer has been adjusted together with the ID Unit, which is supplied with the measuring unit. The ID Unit, which has the same code number and the same serial number as the measuring unit, must be installed in the display unit. This means that if the ID Unit is replaced the measuring unit can be connected to another corresponding display unit.■The workpiece and measuring conditionsDepending on whether the laser is visible or invisible, the workpiece shape, and the surface roughness, measurement errors may result. If this is the case, perform calibration with a master workpiece which has dimensions, shape, and surface roughness similar to the actual workpiece to be measured. If measurement values show a large degree of dispersion due to the measuring conditions, increase the number of scans for averaging to improve the measurement accuracy.■Electrical interferenceTo avoid operational errors, do not route the signal cable and relay cable of the Laser Scan Micrometer alongside a high voltage line or other cables capable of inducing noise current in nearby conductors. Ground all appropriate units and cable shields.■Connection to a computerIf the Laser Scan Micrometer is to be connected to an external personal computer via the RS-232C interface, ensure that the cable connections conform to the specication.■Re assembly after removal from the baseObserve the following limits when re assembling the emission unit and reception unit to minimize measurement errors due tomisalignment of the laser's optical axis with the reception unit.■Laser safetyMitutoyo Laser Scan Micrometers use a low-power visible laser for measurement. The laser is a CLASS 2 EN/IEC60825-1 (2007) device. Warning and explanation labels, as shown right, are attached to the Laser Scan Micrometers as is appropriate.Laser Scan Micrometers Quick Guide to Precision Measuring Instrumentsa. Parallel deviation between reference lines C and D: X (in the transverse direction)■ Alignment within the horizontal planeb. Angle between reference lines C and D: θx (angle)c. Parallel deviation between reference planes A and B: Y (in height)■ Alignment within the vertical planed. Angle between reference planes A and B: θy (angle)ModelDistance between Emission Unitand Reception UnitX and Yθx and θy544-533, 544-534 68mm ( 2.68") or lesswithin 0.5mm (.02")within 0.4˚ (7mrad)100mm ( 3.94") or lesswithin 0.5mm (.02")within 0.3˚ (5.2mrad)544-535, 544-536130mm ( 5.12") or lesswithin 1mm (.04")within 0.4˚ (7mrad)350mm (13.78") or lesswithin 1mm (.04")within 0.16˚ (2.8mrad)544-537, 544-538273mm (10.75") or lesswithin 1mm (.04")within 0.2˚ (3.5mrad)700mm (27.56") or lesswithin 1mm (.04")within 0.08˚ (1.4mrad)544-539, 544-540321mm (12.64") or lesswithin 1mm (.04")within 0.18˚ (3.6mrad)700mm (27.56") or lesswithin 1mm (.04")within 0.08˚ (1.4mrad)544-541, 544-542800mm (31.50") or lesswithin 1mm (.04")within 0.05˚ (1.6mrad)l Allowable limits of optical axis misalignmentXReference line CReference line DxReference line CReference line DYReference plane AReference plane ByReference plane AReference plane B

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