MEASURING INSTRUMENTS CATALOG No.E2019
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L-6LMitutoyo reserves the right to change any or all aspects of any product specication, including prices, designs and service content, without notice.SPECIFICATIONSModel No.SJ-500SV-2100M4*1SV-2100S4*1SV-2100H4*1SV-2100W4*1Stand type(Optional)*2Manual standMotorized standMeasuring rangeZ1 axis (detector)800 µm, 80 µm, 8 µmX axis50 mm100 mmResolutionX axis0.05 µmZ1 axis (detector)0.01 µm (800 µm), 0.001 µm (80 µm), 0.0001 µm (8 µm)Z2 axis (column)——1 µmAssessed profilePrimary profile, Roughness profile, Waviness profile, DF profile, Roughness motif profile, Waviness motif profile*1 While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon.*2 Stand for SJ-500 is optional. Surftest SJ-500/SV-2100SERIES 178 — Dedicated Control Unit Type Surface Roughness TesterA superior data processing tester with PC data analysis for higher efficiency.High precision and high performance type surface roughness tester with a dedicated control unit, offering a user-friendly display and simple operation.• Equipped with a 7.5-inch, color TFT LCD, large color icons and touch panel controls, the display unit is easy to read and simple to operate.• A built-in joystick on the control unit allows quick and easy positioning. The manual adjustment knob allows fine positioning of a small stylus for measuring small holes.• In addition to the roughness parameters compliant with ISO/JIS/ANSI/VDA surface roughness standards, contour analysis is also available.An inspection certicate is supplied as standard. Refer to page U-11 for details.An inspection certicate is supplied as standard. Refer to page U-11 for details.SJ-500SV-2100M4SV-2100S4Refer to the Surftest SJ-500/SV-2100 Brochure (No. E15006) for more details.Surftest SJ-500P/SV-2100M4Data Processing Unit (PC) Surface Roughness TestersType of data processing unitPC typeModel No.SJ-500P SV-2100M4*2Elevating shaft mechanism of stand —*1Manual operation onlyMeasuring rangeX axis50 mm100 mmZ1 axis (detector)800 µm/80 µm/8 µmZ2-axis (column) travel range—350 mmResolutionX axis0.05 µmZ1 axis (detector)0.01 µm (800 µm), 0.001 µm (80 µm), 0.0001 µm (8 µm)Z2 axis (column)——Drive speedX axis0 to 20 mm/s or manual operation 0 to 40 mm/s or manual operationZ2 axis (column)—Manual operation onlyApplicable standardsJIS 1982/JIS 1994/JIS 2001/ISO 1997/ANSI/VDAAssessed profilePrimary profile, Roughness profile, Waviness profile, Filtered waviness profile, Rolling circle waviness profile, Rolling circle center line waviness profile, Envelope residual profile, DIN4776 profile, Roughness motif profile, Waviness motif profile*1 The simplified stand or manual column stand is available as an optional accessory. *2 While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon.SPECIFICATIONSSoftware is selectable from FORMTRACEPAK or SURFPAK-EZ.SJ-500PSV-2100M4 (PC type)FORMTRACEPAK: Best-selling Surface Roughness Analysis ProgramBest-selling dedicated software for surface roughness measurement and analysis. Features a flexible printer format and creation of an original inspection certificate.Products equipped with the measurement data output function can be connected to the measurement data network system MeasurLink (refer to page A-5 for details).Products equipped with the measurement data output function can be connected to the measurement data network system MeasurLink (refer to page A-5 for details).

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