MEASURING INSTRUMENTS CATALOG No.E2016
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L-27LFormtracerHybrid machine with dual-role capabilityMitutoyo operates a policy of continuous improvement that aims to provide the customer with the benet of the latest technological advances.Therefore the company reserves the right to change any or all aspects of any product specication without notice.•The combination of a surface roughness tester and contour measuring instrument saves installation space.Surface roughness testing function• Z1-axis detector provides highest resolution of 0.0001μm (when the measuring range is 8µm) is provided as standard.• High-accuracy glass scales, built-in on the X axis, directly read the drive unit movement. Greatly facilitates spacing parameter evaluation while achieving high-accuracy positioning.• Measuring force for the detector is selectable from 4mN or 0.75mN.Contour measuring function• The Z1 axis (detector) is equipped with a high-precision arc scale and newly designed arm. The high-precision arc scale can directly read the arc track of the stylus tip to achieve high accuracy and resolution. The new arm has extended the Z1-axis measuring range by 10 mm while reducing the chance of interference with workpieces compared to conventional models. The arm mount can be attached/detached with a single touch on the magnet joint for improved ease of operation.•The following two features have been added exclusively for the SV-C-4500 series as functions dedicated to contour measuring systems.(1) Continuous measurement in the vertical direction (up/down) is available in combination with a double-tipped stylus.Up/down continuous measurement data facilitates the analysis of the effective diameter of screw threads, which has been difficult to measure in the past.(2) The measuring force can be set in the FORMTRACEPAK software. Weight replacement and position adjustment are not required to adjust the measuring force.•The 700mm Z2-axis (column) range models are new to the lineup.An inspection certicate is supplied as standard. Refer to page X for details.Formtracer SV-C3200/4500SERIES 525 — Surface Roughness and Contour Measuring SystemsSurface roughness testingContour measuringFormtracerRefer to the Formtracer SV-C3200/4200 series (Catalog No.E15012) for more details.Downward (Bottom plane) measurementUpward/downward measurement direction is switchable in the softwareUpward (Top plane) measurementSPECIFICATIONSModel No.SV-C3200S4SV-C3200H4SV-C3200W4SV-C3200L4SV-C3200S8SV-C3200H8SV-C3200W8SV-C3200L8SV-C4500S4SV-C4500H4SV-C4500W4SV-C4500L4SV-C4500S8SV-C4500H8SV-C4500W8SV-C4500L8• Surface roughness measurementMeasuring rangeX axis (drive unit)100mm200mmZ1 axis (detector)800µm/80µm/8µmStraightness(0.05+L/1000) μm L: traverse length (mm)(0.1+0.002L) μm L: traverse length (mm)ResolutionZ1 axis (detector)0.01µm(800µm), 0.001µm(80µm), 0.0001µm(8µm)Measuring force0.75mN (when the Code No. of the main unit ends with "-1") / 4mN (when the Code No. of the main unit ends with "-2")Stylus tip shape 60°, 2µmR (when the Code No. of the main unit ends with "-1") / 90°, 5µmR (when the Code No. of the main unit ends with "-2")Applicable standardsJIS1982/ JIS1994/ JIS2001/ ISO1997/ ANSI/ VDAParameterPa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, Pq, Pmr(C), Pmr, Pc, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, Rq, Rmr(C), Rmr, Rc, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, Wq, Wmr(C), Wmr, Wc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, Ir, a, a, q, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAWAssessed prolePrimary prole, Roughness prole, Filtered waviness prole, Waviness prole, Rolling circle waviness primary prole, Rolling circle waviness prole, Envelope residual prole, DF prole (DIN4776/ ISO13565-1), Roughness motif (Envelope waviness prole is displayed when evaluating the motif.)Analysis graphMaterial ratio curve, Prole height amplitude distribution curve, Power spectrum chart, Auto-correlation chart, Walsh power spectrum chart, Walsh auto-correlation chart, Slope distribution chart, Local peak distribution chart, Parameter distribution chart (Contour analysis function can analyze the area of abrasion amount and overlay.)Data compensation functionsLeast squares straight line, R-surface compensation, Ellipse compensation, Parabola compensation, Hyperbolic compensation, Conic compensation, Polynomial compensation (auto or arbitrary 2nd to 7th), No compensationFilterGaussian lter, 2CRPC75, 2CRPC50, 2CR75, 2CR50, Robust spline lter• Contour measurementMeasuring rangeX axis (drive unit)100mm200mmZ1 axis (detector)60mm (±30mm from the horizontal)Straightness0.8µm/100mm2µm/200mmAccuracyX axis (drive unit)±(0.8+0.01L)µm L: traverse length (mm)±(0.8+0.02L)µm L = traverse length (mm)Z1 axis (detector)SV-C3200 series: ±(1.4+|2H|/100)μm, SV-C4500 series: ±(0.8+|2H|/100)μmH: Probing height from the horizontal (mm)ResolutionX axis (drive unit)0.05 µmZ1 axis (detector)SV-C3200 series: 0.04µm, SV-C4500 series: 0.02µmZ2 axis (column)1 µmMeasuring forceSV-C3200 series: 30mN (adjustment using weights)SV-C4500 series: 10, 20, 30, 40, 50mN (switching on the software)Face of stylusSV-C3200 series: Vertical direction (up/down, single measurement)SV-C4500 series: Vertical direction (up/down, available for continuous measurement)• Common specicationZ2-axis (column) moving range300mm500mm700mm300mm500mm700mmX axis Inclination range±45°Drive speedX axis0 to 80mm/s or manual operationZ2 axis (column)0 to 30mm/s or manual operationMeasuring speed0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0, 10, 20mm/s Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon.Z1-axis measuring range has been extended by 10mm.• CV-3100/4100 (conventional model)• CV-3200/450050mm10 mm60mm19 mmSV-C3200L4 (with options)SV-C3200S4

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