MEASURING INSTRUMENTS CATALOG No.E2016
L-9LSurftestPerforms brilliantly in many situations such as in the quality control room, on the factory oor and on the production line. Mitutoyo operates a policy of continuous improvement that aims to provide the customer with the benet of the latest technological advances.Therefore the company reserves the right to change any or all aspects of any product specication without notice.Highly precise, high-performance surface roughness testers that use the advantages of sophisticated analysis software. The SJ-500P is a stand-alone instrument whereas the SV-2100M4 is a benchtop machine incorporating a precision column with manual drive.• Simple setup for surface roughness measuring conditions. A simple input function is used to calculate according to ISO/JIS roughness standard drawing instruction symbols. Complicated measuring condition settings can easily be entered by selecting a drawing instruction symbol from the surface roughness menu.Refer to the Surftest SJ-500/SV-2100 (Catalog No.E15006) for more details.Surftest SJ-500P/SV-2100M4Data Processing Unit (PC) Surface Roughness TestersSoftware is selectable from FORMTRACEPAK or SURFPAK-EZ.SJ-500PSV-2100M4 (PC type)Intuitive operation is available thanks to the user-friendly graphic display and button layout. Simplified contour analysis functions such as step, area, angle, and circle calculation are provided as standard.Best-selling dedicated software for surface roughness measurement and analysis. Features a flexible printer format and creation of an original inspection certificate.Screen displaying the measurement properties and resultsScreen for calibration and control (For SJ-500P)Screen for the simplied contour analysis functionScreen displaying the measurement properties and resultsScreens displaying the conditionsPrinting screenType of data processing unitPC typeModel No.SJ-500P SV-2100M4※Elevating shaft mechanism of stand ̶*1Manual operation onlyMeasuring rangeX axis50mm100mmZ1 axis (detector)800µm / 80µm / 8µmZ2-axis (column) moving range̶350mmResolutionX axis0.05µmZ1 axis (detector)0.01µm（800µm）, 0.001µm（80µm）, 0.0001µm（8µm）Z2 axis (column)̶̶Drive speedX axis0 to 20mm/s or manual operation 0 to 40mm/s or manual operationZ2 axis (column)̶Manual operation onlyMeasuring speed0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0mm/sStraightness0.2µm / 50mm*20.15µm / 100mmX-axis operationFrom PC/ with manual knobMeasuring force/Stylus tip angle, RadiusDepends on the Code No.: 0.75mN/60°, 2µm (when the Code No. ends with "-01")4mN/90°, 5µm (when the Code No. ends with "-02")Applicable standardsJIS1982/ JIS1994/ JIS2001/ ISO1997/ ANSI/ VDAAssessed prolePrimary prole, Roughness prole, Waviness prole, Filtered waviness prole, Rolling circle waviness prole, Rolling circle center line waviness prole, Envelope residual prole, DIN4776 prole, Roughness motif prole, Waviness motif proleParameterPa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, P∆q, Pmr（c）, Pmr, Pδc, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, R∆q, Rmr（c）, Rmr, Rδc, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, W∆q, Wmr（c）, Wmr, Wδc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, ∆a, λa, λq, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAWAnalysis graphADC, BAC, Power spectrum chart, Auto-correlation chart, Walsh power spectrum chart, Walsh auto-correlation chart, Slope distribution chart, Local peak distribution chart, Parameter distribution chartData compensation functionsTilt compensation (General/First half/Second half/Anchor/Arbitrary), R-surface compensation, Ellipse compensation, Parabola compensation, Hyperbolic compensation, Conic compensation, Polynomial compensationContour analysis functionWhen using SURFPAK-EZ*3: Step, Circle, Angle, Area, Coordinate differenceFilterGaussian, 2CR75, 2CR50, 2CRPC75, 2CRPC50, Robust-SplineBase size (W×D)̶*1600×450mmBase material̶*1GabbroExternal dimensions（W×D×H）Main unit425×94 ×160mm716 × 450×863mmDisplay unit̶*4̶*4Motorized unit̶̶PC I/F Unit350×263×86mmMassMain unit2.7 kg140 kgDisplay unit̶*4̶*4Motorized unit̶̶PC I/F Unit3.8 kgNote: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is known can always be relied upon.*1: The simplied stand or manual column stand is available as optional accessory. (Refer to page L-15 for details.)*2: When using the simplied stand (optional): 0.4µm/50mm, When using the manual column stand (optional): 0.3µm/50mm*3: When using FORMTRACEPAK, please inquire separately.*4: Depends on the PC systemFORMTRACEPAK: Best-selling Surface Roughness Analysis ProgramSURFPAK-EZ: Easy Operation Focusing on OperabilitySPECIFICATIONSConventional setting methodNew Drawing instruction setting methodAn inspection certicate is supplied as standard. Refer to page X for details.