MEASURING INSTRUMENTS CATALOG No.E2016
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J-27JMicroscopesMicroscope lineups that systemize observation, measurement and processingMitutoyo operates a policy of continuous improvement that aims to provide the customer with the benet of the latest technological advances.Therefore the company reserves the right to change any or all aspects of any product specication without notice.25.5 (W.D.)ø3769.595(Parfocal distance)5ø3725.5 (W.D.)ø3769.595(Parfocal distance)5ø37378-867-5378-868-537.5 (W.D.)ø34ø23ø23.857.595(Parfocal distance)5ø32.230.5 (W.D.)ø34ø24.8ø25.264.595(Parfocal distance)51ø32.217 (W.D.)ø34ø24ø24.4ø27ø287895(Parfocal distance)5ø32.212 (W.D.)ø34ø24.6ø258395(Parfocal distance)5ø32.210 (W.D.)ø398595(Parfocal distance)5ø3720 (W.D.)ø347595(Parfocal distance)5ø32.210 (W.D.)ø398595(Parfocal distance)5ø37378-822-5378-824-5378-823-5378-825-5378-826-5378-863-5378-864-5Near-infrared Radiation Corrected M Plan Apo NIR B for Bright-eld Observation Order No.Mag.NAW.D.fRD.F.View eld 1View eld 2Mass378-867-520X0.4025.5mm10mm0.7µm1.7µmø1.2mm0.24x0.32mm350g378-868-550X0.4225.5mm4mm0.7µm1.6µmø0.48mm0.10x0.13mm375gNear-infrared Radiation Corrected M Plan Apo NIR/M Plan Apo NIR HR for Bright-eld ObservationOrder No.Mag.NAW.D.fRD.F.View eld 1View eld 2MassM Plan Apo NIR378-822-55X0.1437.5mm40mm2.0µm14.0µmø4.8mm0.96x1.28mm220g378-823-510X0.2630.5mm20mm1.1µm4.1µmø2.4mm0.48x0.64mm250g378-824-520X0.4020.0mm10mm0.7µm1.7µmø1.2mm0.24x0.32mm300g378-825-550X0.4217.0mm4mm0.7µm1.6µmø0.48mm0.10x0.13mm315g378-826-5100X0.5012.0mm2mm0.6µm1.1µmø0.24mm0.05x0.06mm335gM Plan Apo NIR HR378-863-550X0.6510mm4mm0.4µm0.7µmø0.48mm0.10x0.13mm450g378-864-5100X0.7010mm2mm0.4µm0.6µmø0.24mm0.05x0.06mm450gNote:These objectives are designed so that a workpiece's image can be focused within the focal depth even when the wavelength used is changed anywhere from the visible range (l = 480nm) up to near-infrared range (l = 1800nm). Therefore the M Plan NIR Series are suitable for laser repair. However, when the wavelength used exceeds 1100nm, the focussing position may slightly deviate from that in the visible range due to changes in glass dispersion and refractive index.DIMENSIONSUnit: mmDIMENSIONSUnit: mmMag.:MagnicationNA:Numerical apertureW.D.:Working distancef:Focal distanceR:Resolving powerD.F.:Focal depthView eld 1:Field of view when using ø24mm eyepieceView eld 2:Field of view when using 1/2” CCD camera20.35 (W.D.)ø3475.0295.375ø32.217.5 (W.D.)ø34ø24ø24.477.87/77.7495.37/95.245ø32.212.5 (W.D.)ø34ø24.6ø2582.8795.375ø32.212 (W.D.)ø34ø24.6ø2583.2495.245ø32.2378-827-5378-828/829-5378-752-5378-754-5Near-Infrared Radiation and LCD Glass Thickness (t = 1.1mm or 0.7mm) Corrected LCD Plan Apo NIR for Bright-eld ObservationOrder No.Mag.NAW.D.fRD.F.View eld 1View eld 2Mass378-827-520X0.4019.98mm*10mm0.7µm1.7µmø1.2mm0.24x0.32mm305g378-828-550X0.4217.13mm*3.9mm0.7µm1.6µmø0.48mm0.10x0.13mm320g378-829-550X0.4217.26mm*3.9mm0.7µm1.6µmø0.48mm0.10x0.13mm320g378-752-5100X0.5012.13mm*2mm0.6µm1.1µmø0.24mm0.05x0.06mm335g378-754-5100X0.5011.76mm*2mm0.6µm1.1µmø0.24mm0.05x0.06mm335g*In airNote:These near-infrared (l = 1800nm) corrected objectives are designed for observing a workpiece through LCD glass (thickness = 1.1mm (378-827-5, 378-828-5, 378-752-5) or 0.7mm (378-829-5, 378-754-5)) and for laser repair.DIMENSIONSUnit: mm

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